TR technology + Half Cell
TR technology with Half cell aims to eliminate the cell gap to increase module efficiency (mono-facial up to 20.93%)
Low Light Induced Degradation
The N-type cell shows extremely low light induced degradation (LID) performance when comparing with the P-type cell.
9BB instead of 5BB
9BB technology decreases the distance between bus bars and finger grid line which is benefit to power increase.
POWER YIELD
Higher lifetime Power Yield 1% first year degradation, 0.4% linear degradation
Best Warranty
15 year product warranty, 30 year linear power warranty
Better low-light performance
Excellent performance in low-light environments (e.g. early morning, dusk, and cloud, etc.)